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SEM-high temperature in situ system - basic edition
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SEM-high temperature in situ system - basic edition
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SEM-high temperature in situ system - basic edition applies thermal field control to samples through MEMS chip, builds thermal field automatic control and feedback measurement system in the in-situ sample stage, and combines EDS, EBSD and other test modes to achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, atomic-level structure and composition evolution of samples under vacuum environment caused by temperature changes from nanometer or even atomic level.
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