Overview

Brief description of the working principle of transmission electron microscope

The accelerated and focused electron beam is projected onto a very thin sample, and the electrons collide with the atoms in the sample and change their direction, thus producing a three-dimensional angle scattering. The size of the scattering angle is related to the density and thickness of the sample, so different images of light and dark can be formed. At present, the resolution of advanced electron microscopes in the world can reach the far sub-angstrom level (<0.5Å), which can be used to observe ultra-microstructures. At the same time, the normal operation of high-precision equipment and the acquisition of performance indicators often place high demands on the environment in which it is located.

Necessity of environmental construction

Electron microscopes require a stable operating environment so that they can reach or even exceed the performance indicators of electron microscope manufacturers. Any disturbance beyond the electron microscope's allowance will affect its operation, and the higher the configuration, performance, and analysis accuracy of the electron microscope, the higher the requirements for the environmental indicators around the electron microscope. Therefore, a practical and feasible environmental transformation of the electron microscope laboratory directly affects the stable performance of the electron microscope's high performance.