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SEM- high temperature in-situ system
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隐藏域元素占位
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The SEM- high temperature in-situ system applies thermal field control to the sample through the MEMS chip, builds an automatic thermal field control and feedback measurement system in the in-situ sample stage, and combines various modes such as EDS and EBSD to achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and atomic-level structure and composition evolution at the surface/interface caused by temperature changes in a vacuum environment from a nano or even atomic level.
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