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SEM- high temperature mechanical in-situ system

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SEM- high temperature mechanical in-situ system

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    The SEM- high temperature mechanical in-situ system uses a MEMS chip to construct a force and heat composite multi-field automatic control and feedback measurement system in the in-situ sample stage. Combined with multiple different modes such as EDS and EBSD, it can realize real-time and dynamic monitoring of key information such as microstructure evolution, phase change, element valence, microstress, and structure and composition evolution at the surface/interface caused by changes in temperature and applied force in a vacuum environment at the nanometer level.

     

    project

    parameter

    Platform material

    High strength aviation aluminum alloy

    Control method

    High Precision Piezoelectric Ceramics

    Sample stage tilt angle

    360° rotation and ±90° tilt

    Applicable electron microscope

    Mainstream electron microscopes such as ZEISS, Thermo Fisher, etc.

    EBSD/EDS

    support

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