TEM-high tilt angle thermoelectric in-situ system applies thermal and electric field control to samples through MEMS chip, builds thermoelectric composite multi-field automatic control and feedback measurement system in the high tilt angle sample stage, and combines EDS, EELS, SAED, HRTEM, STEM and other different modes to achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress and atomic-level structure and composition evolution of samples at the surface/interface caused by changes in temperature and electric field in a vacuum environment from the nanometer or even atomic level.

project	parameter
Rod material	High Strength Titanium Alloy
Number of electrodes	4
Window film thickness	No film or 20nm
Drift rate	＜0.5 nm/min（Steady state）
Tilt Angle	α ≥ ±75° (actual range depends on pole piece model)
Applicable electron microscope	Thermo Fisher/FEI, JEOL, Hitachi
Applicable pole shoes	ST, XT, T, BioT, HRP, HTP, CRP
(HR)TEM/STEM	support
(HR)EDS/EELS/SAED	Heating process and high temperature detection support