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TEM-high-temperature electromechanical in-situ system

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TEM-high-temperature electromechanical in-situ system

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    TEM-high-temperature electromechanical in-situ system applies mechanical, electric and thermal field control to samples through MEMS chips, builds a force, electricity and heat composite multi-field automatic control and feedback measurement system in the in-situ sample stage, and combines EDS, EELS, SAED, HRTEM, STEM and other different modes to achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress and structure and composition evolution at the surface/interface of samples in a vacuum environment caused by changes in temperature, electric field and applied force at the nanometer level.

     

    project

    parameter

    Rod material

    High Strength Titanium Alloy

    Control method

    High Precision Piezoelectric Ceramics

    Tilt Angle

    α≥±20°, tilt resolution＜0.1° (actual range depends on TEM and pole shoe model)

    Applicable electron microscope

    Thermo Fisher/FEI, JEOL, Hitachi

    Applicable pole shoes

    ST, XT, T, BioT, HRP, HTP, CRP

    (HR)TEM/STEM

    support

    (HR)EDS/EELS/SAED

    support

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