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TEM-force electric in-situ system

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TEM-force electric in-situ system

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    The TEM-force electric in-situ system uses a MEMS chip to construct a force and electric composite multi-field automatic control and feedback measurement system in the in-situ sample stage. Combining multiple modes such as EDS, EELS, SAED, HRTEM, and STEM, it can achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and structure and composition evolution at the surface/interface of the sample in a vacuum environment as the electric field and applied force change in the nanometer level.

     

    project

    parameter

    Shaft Material

    High Strength Titanium Alloy

    Control method

    High Precision Piezoelectric Ceramics

    Tilt Angle

    α≥±20°, tilt resolution＜0.1° (actual range depends on TEM and pole shoe model)

    Applicable electron microscope

    Thermo Fisher/FEI, JEOL, Hitachi

    Applicable pole shoes

    Suitable pole pieces for ST, XT, T, BioT, HRP, HTP, CRP

    (HR)TEM/STEM

    support

    (HR)EDS/EELS/SAED

    support

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