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TEM-dual tilt probe electrical in-situ system

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TEM-dual tilt probe electrical in-situ system

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Sample Holder

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  • Detail

    The TEM-dual tilt probe electrical in-situ system applies electric field control to the sample through nanoprobes, and combines multiple different modes such as EDS, EELS, SAED, HRTEM, STEM, etc. to achieve real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and structure and composition evolution at the surface/interface caused by changes in the electric field in a vacuum environment at the nanometer level.

     

    project

    parameter

    Rod material

    High Strength Titanium Alloy

    Control method

    High Precision Piezoelectric Ceramics

    Tilt Angle

    α≥±20°, β≥±20° (the actual range depends on the TEM and pole shoe model)

    Applicable electron microscope

    Thermo Fisher/FEI, JEOL, Hitachi

    Applicable pole shoes

    ST, XT, T, BioT, HRP, HTP, CRP

    (HR)TEM/STEM

    support

    (HR)EDS/EELS/SAED

    support

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