The TEM-dual tilt photothermal in-situ system constructs a thermal and optical composite multi-field automatic control and feedback measurement system in the in-situ sample stage through the light source introduced by the MEMS chip and optical fiber. Combining multiple different modes such as EDS, EELS, SAED, HRTEM, STEM, etc., it can realize real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and atomic-level structure and composition evolution at the surface/interface of the sample caused by changes in temperature and light field in a vacuum environment from the nanometer or even atomic level.

project	parameter
Rod material	High Strength Titanium Alloy
Number of electrodes	2
Window film thickness	No film or 20nm
Drift rate	＜0.5 nm/min（Steady state）
Tilt Angle	α ≥ ±25°, β ≥ ±25° (actual range depends on pole piece model)
Applicable electron microscope	ThermoFisher/FEI, JEOL, Hitachi
Applicable pole shoes	ST, XT, T, BioT, HRP, HTP, CRP
(HR)TEM/STEM	support
(HR)EDS/EELS/SAED	Support heating process and high temperature detection