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PicoMill® TEM specimen preparation system
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隐藏域元素占位
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● Highest sample quality - no amorphous and implanted layers
● Supplement FIB technology
● Milling without introducing the workpiece
● Advanced detector technology for imaging and precise endpoint detection
● Ion and electron in situ imaging
● Microscope connection allows risk-free sample handling
● Increase functionality and capacity
● Fast, reliable and easy to use
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Contact Information
Please leave the demand accurately for accurate matching and fast docking, or call the service hotline directly. 021-64301021
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