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NanoMill® TEM specimen preparation system
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隐藏域元素占位
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● Unique focused micro-beam inert gas ion beam;
● Extremely low repair voltage: 50 eV;
● Focused beam spot diameter: 1μm;
● High positioning accuracy, removing amorphous layer without redeposition;
● Use argon ion beam to stimulate secondary electron imaging to achieve repair and positioning at the same time;
● The ion beam can be directed to a fixed position or to a selected area for fine repair;
● Equipped with liquid nitrogen cooling stage to remove thermal damage.
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Please leave the demand accurately for accurate matching and fast docking, or call the service hotline directly. 021-64301021
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