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TEM-tomography holders

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隐藏域元素占位

TEM-tomography holders

Classification:

Sample Holder

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  • Detail

    TEM-tomography holders obtain two-dimensional imaging information of samples through a series of different tilt angles, and process it into three-dimensional information. The sample stage can directly assemble a copper mesh sample with a diameter of 3 mm. It can not only perform three-dimensional reconstruction of the sample, but also be used for high-resolution analysis of high-angle annular dark field imaging (HAADF-STEM) in the scanning transmission mode of the sample material.

     

    project

    parameter

    Rod material

    High Strength Titanium Alloy

    Drift rate

    <0.5 nm/min(Steady state)

    Resolution

    Electron microscope limit resolution

    (HR)TEM/STEM

    support

    (HR)EDS/EELS/SAED

    support

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