The transmission electron microscope dual-tilt thermoelectric in-situ system uses a MEMS chip to construct a thermal and electrical composite multi-field automatic control and feedback measurement system in the in-situ sample stage. Combining multiple different modes such as EDS, EELS, SAED, HRTEM, STEM, etc., it can realize real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and atomic-level structure and composition evolution at the surface/interface of the sample caused by changes in temperature and electric field in a vacuum environment from a nanometer or even atomic level.

project	parameter
Number of electrodes	4
Window film thickness	No film or20nm
drift	＜0.5 nm/min（stable state）
Tilt angle	α ≥ ±25°，β ≥ ±25°（The actual range depends on the extreme shoe model）
Applicable electron microscope	Thermo Fisher/FEI, JEOL, Hitachi
Suitable for extreme boots	ST, XT, T, BioT, HRP, HTP, CRP
(HR)TEM/STEM	support
(HR)EDS/EELS/SAED	Support heating process and high temperature detection