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Metallographic microscope MOTIC PA53MET

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Metallographic microscope MOTIC PA53MET

Classification:

MOTIC

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  • Detail

    Excellent optical system demonstrates outstanding optical performance in a large number of inspection tasks.

    characteristic:

    ● Reflected light illuminating device: Reflected light illuminating device provides various observation methods (bright field, dark field, polarization, differential interference, etc.) to meet the needs of various sample inspections.

    ● Polarizer and analyzer: The combination of polarizer and analyzer can be quickly and easily switched from DIC/POL observation mode to other observation modes. In fact, the plug-in design of polarizer and analyzer is easy to remove and insert from the microscope.

    ● Best performance DIC: Using an insertable DIC prism, the Motic microscope can easily switch from other observation modes to differential interference observation at any magnification, as the differential interference position remains unchanged.

    ● Transmitting light system and spotlight: ND6, ND25, and LB filters are built into the transmitting light path, and multiple spotlight options are available.

    ● Z-axis module: The 3D analysis system achieves surprising results by converting all 2D images generated in Motic Analysis software into 3D configuration files.

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