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TEM-high temperature mechanical in-situ system

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TEM-high temperature mechanical in-situ system

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Sample Holder

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    TEM-high temperature mechanical in-situ system uses MEMS chip to construct a force and heat composite multi-field automatic control and feedback measurement system in the in-situ sample stage. Combining EDS, EELS, SAED, HRTEM, STEM and other different modes, it can realize real-time and dynamic monitoring of key information such as microstructure, phase change, element valence, microstress, and structure and composition evolution at the surface/interface of the sample in a vacuum environment as the temperature and applied force change from the nanometer level.

     

    Project

    Parameter

    Rod material

    High Strength Titanium Alloy

    Control method

    High Precision Piezoelectric Ceramics

    Tilt Angle

    α≥±20°, tilt resolution＜0.1° (actual range depends on TEM and pole shoe model)

    Applicable electron microscope

    Thermo Fisher/FEI, JEOL, Hitachi

    Applicable pole shoes

    ST, XT, T, BioT, HRP, HTP, CRP

    (HR)TEM/STEM

    support

    (HR)EDS/EELS/SAED

    support

     

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