- Commodity name: DVIA-M Series active vibration isolation platform
The DVIA-M is an active isolation platform specially designed for the electron microscope, which is fatally affected by low frequency vibration during SEM, TEM and other nano-unit measurements. Low frequency isolation provides the best environment for the electron microscope to measure high-resolution, high pixel clear images.

The DVIA-M's four active isolation units are equipped with high-performance sensors and actuators with strong braking forces, providing outstanding active isolation performance in the low frequency band of 1-10 Hz, which affects ultra-precision measurement equipment. The DVIA-M starts at 0.5Hz and has a 90% isolation performance at 2Hz and 99% at 10Hz. The air spring inside the DVIA-M isolation unit effectively attenuates vibration at high frequency bands while supporting high weight equipment.

Excellent performance

It has excellent low frequency shock absorption performance and solves the problem of low frequency common shock of passive shock absorber

Stable operation

A large number of installation cases have proved its stable operation ability, and basically no maintenance is required

Excellent after sale

Domestic engineers are responsible for installation and maintenance, after-sales service response is rapid, professional service level has won a good reputation

Before using DVIA-M

After using DVIA-M